Application of wavelength dispersive X-ray spectroscopy in by Matjaž Kavčič PDF

By Matjaž Kavčič

ISBN-10: 9533079673

ISBN-13: 9789533079677

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Extra resources for Application of wavelength dispersive X-ray spectroscopy in X-ray trace element analytical techniques

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1976). Multiplet splitting of X-ray photoelectron lines of chromium complexes. The effect of covalency on the 2p core level spin-orbit separation, Inorganica Chimica Acta, Vol. 16, pp. 41-45, ISSN 0020-1693. ; Sinha, S. B. (1989). XPS studies of nitrogen ion implanted zirconium and titanium. Journal of Electron Spectroscopy and Related Phenomena, Vol. 49, No. 3, pp. 303-309, ISSN 0368-2048. ; Cunha, L. & Moura, C. (2001). Characterisation of chromium nitride films produced by PVD techniques, Thin Solid Films, Vol.

The XPS results demonstrate that Cr and the Al atoms have been bonded with N in the forms of nitride. The elemental concentration of the Cr–Al-N film was controlled by adjusting the applied power of the Cr-Al binary target, and the Ar/N2 gas mixture. Generally, formative N (Cr, Al) phase with good crystallization indicates that the aluminium and titanium activity and activation energy provided by the present deposition conditions are enough for the formation of a Cr–Al–N coating. Although the surface temperature of the substrate during deposition of a Cr–Al– N film is around 250 °C, the substrate lies in a high-density plasma region and a high ionto-atom ratio of chromium, aluminium and nitrogen can be propitious to the formation of Cr–Al–N phase proven by XPS results.

So, the random distribution of the interaction point increases the fluctuations on the induced charge and thus produces peak broadening in the energy spectra. The charge transport properties of a semiconductor, expressed by the hole and electron mobility lifetime products (hh and ee) are key parameters in the development of radiation detectors. Poor mobility lifetime products result in short λ and therefore small λ /L ratios, which limit the maximum thickness and energy range of the detectors.

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Application of wavelength dispersive X-ray spectroscopy in X-ray trace element analytical techniques by Matjaž Kavčič

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